No title Testing and reliable design of CMOS circuits /
Jha, Niraj K.
Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu. - Boston : Kluwer Academic Publishers, c1990. - xii, 231 p. : ill. ; 25 cm. - Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing SECS 88. .
Includes bibliographical references.
9781461315254
Metal oxide semiconductors, Complementary--Testing.
Metal oxide semiconductors, Complementary--Reliability.
Integrated circuits--Very large scale integration--Design and construction.
621.39732/ J598t
Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu. - Boston : Kluwer Academic Publishers, c1990. - xii, 231 p. : ill. ; 25 cm. - Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing SECS 88. .
Includes bibliographical references.
9781461315254
Metal oxide semiconductors, Complementary--Testing.
Metal oxide semiconductors, Complementary--Reliability.
Integrated circuits--Very large scale integration--Design and construction.
621.39732/ J598t