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Fundamentals of atomic force microscopy / Part I / Ronald Reifenberger

By: Material type: TextTextSeries: ; vol: 4Publication details: New York : World Scientific, c2015.Description: xv, 324p. : ill, figs, tables. 23cmISBN:
  • 9789814630344
Subject(s): DDC classification:
  • 502.82/ R149f 23
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Book Book Daffodil International University Library General Stacks Non-fiction 502.82/ R149f (Browse shelf(Opens below)) 1 Available 031739
Book Book Daffodil International University Library General Stacks Non-fiction 502.82/ R149f (Browse shelf(Opens below)) 2 Available 031740
Book Book Daffodil International University Library General Stacks Non-fiction 502.82/ R149f (Browse shelf(Opens below)) 3 Available 031741
Total holds: 0

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