Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, William M. Hughes.
Material type:
TextPublication details: U.S.A : ASTM, c1998.Description: 392 p. : ill., figs. ; 24 cmISBN: - 0803124899
- 621.38152/ G977r 23
- TK7871.852Â .R43 1998
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Book
|
Daffodil International University Library General Stacks | Non-fiction | 621.38152/ G977r (Browse shelf(Opens below)) | 1 | Available | 005246 | |||
|
Book
|
Daffodil International University Library General Stacks | Non-fiction | 621.38152/ G977r (Browse shelf(Opens below)) | 2 | Available | 005247 |
Browsing Daffodil International University Library shelves, Shelving location: General Stacks, Collection: Non-fiction Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 621.38152/ B575s No title Semiconductor optoelectronic devices / | 621.38152/ B575s No title Semiconductor optoelectronic devices / | 621.38152/ G977r Recombination lifetime measurements in silicon / | 621.38152/ G977r Recombination lifetime measurements in silicon / | 621.38152/ N147m Microelectronic devices / | 621.38152/ P665s Semiconductor optoelectronic devices : | 621.38152/ S471 No title Semiconductor fabrication : technology and metrology / |
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.
Includes bibliographical references and indexes.
CSE, EEE, ETE
There are no comments on this title.