Jha, Niraj K. <br/><br/>
Testing and reliable design of CMOS circuits / 
by Niraj K. Jha. and Sandip Kundu. 
 - Boston :  Kluwer Academic Publishers,  c1990. 
 - xii, 231 p. :  ill. ;  25 cm. 
 - Kluwer international series in engineering and computer science ;  VLSI, computer architecture, and digital signal processing  SECS 88. .
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>9781461315254 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary--Testing.<br/>Metal oxide semiconductors, Complementary--Reliability.<br/>Integrated circuits--Very large scale integration--Design and construction.
<br/><br/><label>Dewey Class. No.: </label>621.39732/ J598t