TY  - BOOK
AU  - Jha,Niraj K.
AU  - Kundu,Sandip
TI  - Testing and reliable design of CMOS circuits
SN  - 9781461315254
U1  - 621.39732/ J598t 23
PY  - 1990///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Metal oxide semiconductors, Complementary
KW  - Testing
KW  - Reliability
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Design and construction
N1  - Includes bibliographical references
ER  -