Reliability : modeling, prediction, and optimization /
Wallace R. Blischke, D.N. Prabhakar Murthy.
- New York : John Wiley, c2000.
- xxvii, 812 p. : ill., figs., tables ; 24 cm.
- Wiley series in probability and statistics. Applied probability and statistics section .
- Wiley series in probability and statistics. Applied probability and statistics. .
"A Wiley-Interscience publication."
Includes bibliographical references (p. 771-795) and index.