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Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.
Material type:
TextSeries: Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing ; SECS 88.Publication details: Boston : Kluwer Academic Publishers, c1990.Description: xii, 231 p. : ill. ; 25 cmISBN: - 9781461315254
- 621.39732/ J598t 23
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | |
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Daffodil International University Library General Stacks | Non-fiction | 621.39732/ J598t (Browse shelf(Opens below)) | 1 | Available | 026432 | |||
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Daffodil International University Library General Stacks | Non-fiction | 621.39732/ J598t (Browse shelf(Opens below)) | 2 | Available | 026433 | |||
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Daffodil International University Library General Stacks | Non-fiction | 621.39732/ J598t (Browse shelf(Opens below)) | 3 | Available | 026434 | |||
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Daffodil International University Library General Stacks | Non-fiction | 621.39732/ J598t (Browse shelf(Opens below)) | 4 | Available | 026435 |
Total holds: 0
Includes bibliographical references.
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